JENA/Germany, 2018-04-11. ZEISS today introduces a new X-ray imaging instrument, ZEISS Xradia Context microCT, a large field-of-view, non-destructive 3D X-ray microcomputed tomography system. ZEISS Xradia Context is built on time-tested ZEISS Xradia technology, reaping crossover benefits of years of platform advancements and providing investment assurance as the system is uniquely capable of field-conversion to a ZEISS Xradia Versa 3D X-ray microscope (XRM), the instrument that set the bar in high-performance X-ray imaging in the laboratory.
ZEISS Xradia Context is a tomographic imaging solution for a variety of 3D characterization and inspection needs, from research applications in materials and life sciences to industrial use in product development or natural resource exploration. Users easily adjust the system to image large intact samples to reveal interior details in their full 3D context, or small samples to maximize geometric magnification and resolve fine features with high resolution and high contrast. ZEISS Xradia Context offers superb image quality, stability, and usability, along with an efficient workflow environment and high throughput scanning.
Lourens Steger, head of X-ray microscopy at ZEISS USA, says, “We continue to extend the capabilities of our XRM products in the field with newly offered functionality and modules to meet evolving customer needs. ZEISS Xradia Context joins this family and inherits the same commitment to extendibility that ensures an initial investment in advanced X-ray imaging technology will be protected well into the future. ZEISS Xradia Context enables customers to enter into the ZEISS Xradia ecosystem with a system to address their applications today, and room to grow as needed.”
With a robust stage and flexible software-controlled source/detector positioning, users can image large, heavy, and tall samples using the new platform in their full 3D context. A high pixel density detector enables resolution of fine detail even within relatively large imaging volumes, as well as submicron spatial resolution for small samples. Rapid sample mounting and alignment, a streamlined acquisition workflow, fast exposure and data reconstruction times, and an optional autoloader make ZEISS Xradia Context a high throughput imaging instrument to meet a wide range of 3D imaging and characterization needs.
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