Belfast, Northern Ireland, 03 July, 2013. Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today announced the launch of their ‘Extended Range, Dual-AR technology’ on the market leading iKon-M CCD platform, offering extremely broad and high QE coverage, from Ultra Violet through to Near Infrared, in one camera.
Available on the 1 Megapixel iKon-M 934 CCD platform, the Extended Range Dual-AR technology facilitates broadening of the QE range of back-illuminated, deep-depletion sensors through implementation of a new dual anti-reflection coating process on enhanced silicon, developed and characterised by sensor manufacturer e2v (Chelmsford, England). This advancement builds upon the natural NIR superiority of deep depletion sensors and extends sensitivity well into the Visible and UV regions, with ~90% or greater QE in the 400-850 nm range. Fringe Suppression TechnologyTM ensures that etaloning is radically minimized in the near-infrared region.
Colin Coates, Imaging Product Manager at Andor Technology, commented, “The outstanding extended QE performance of the dual-AR deep depletion CCD, combined with the negligible etaloning, constitutes a very attractive solution for long exposure broadband applications, such as astronomy and luminescence microscopy. Furthermore, coupled with the ‘fast kinetics’ microsecond time resolution mode of operation of iKon-M, this sensor option is particularly appealing to ultra-cold matter labs that typically study a range of atoms and ions.”
Further Information :http://www.andor.com/scientific-cameras/ikon-ccd-camera-series/ikon-m-934